The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Nov. 04, 2014
Malvern Instruments Limited, Malvern, Worcestershire, GB;
David Spriggs, Malvern, GB;
MALVERN PANALYTICAL LIMITED, Malvern, Worcestershi, GB;
Abstract
A particle characterization apparatus is disclosed comprising: a light source; a sample cell; a collecting lens and a detector. The light source is operable to illuminate a sample comprising dispersed particles within the sample cell with a light beam along a light beam axis. The light beam axis passes through a first wall of the sample cell, through the sample, and through a second wall of the sample cell, so as to produce scattered light by interactions with the sample. The detector is configured to detect light scattered from the sample. The second wall of the sample cell comprises a lens with a convex external surface through which the light beam axis passes. The collecting lens is arranged to collect and focus scattered light leaving the sample cell onto the detector, and comprises an aspheric surface.