The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Sep. 26, 2013
Novartis Ag, Basel, CH;
Roger Biel, Aschaffenburg, DE;
Matthias Schwab, Amorbach, DE;
Novartis AG, Basel, CH;
Abstract
A method for automated in-line determination of the center thickness of an ophthalmic lens including providing an inspection cuvette () having an optically transparent bottom () and a concave inner surface () and containing the lens immersed in a liquid, providing an interferometer having a light source and a focusing probe () focusing light coming from the light source to a set position () of the lens. Focusing probe () also directs light reflected at the boundary between the back surface of the lens and the liquid as well as light reflected at the boundary between the front surface of the lens and the liquid or at the boundary between the front surface of the lens and the concave inner surface () to a detector of the interferometer. The center thickness of the lens is determined using the light reflected at the respective boundary at the back surface and at the front surface of the lens.