The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
May. 13, 2016
Boe Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Anhui, CN;
Yiqiang Jiang, Beijing, CN;
Qinglong Meng, Beijing, CN;
Zhiyu Qian, Beijing, CN;
Yanping Li, Beijing, CN;
Linlin Wang, Beijing, CN;
Jing Wan, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Hefei Xinsheng Optoelectronics Technology Co., Ltd., Hefei, CN;
Abstract
A testing device and a testing method for an optical film are disclosed. The testing device includes a carrier having a cavity, wherein the cavity is an enclosed space; a test condition providing module disposed in the enclosed space; wherein the optical film is disposed in the enclosed space and the test condition providing module is configured for providing a test condition simulating a real environment in a liquid crystal display module for the optical film. The testing device for an optical film is configured for testing the optical film to be tested.