The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Nov. 24, 2015
Applicant:

Kaiser Optical Systems Inc., Ann Arbor, MI (US);

Inventors:

Patrick Wiegand, Pinckney, MI (US);

James M. Tedesco, Livonia, MI (US);

Joseph B. Slater, Dexter, MI (US);

Francis Esmonde-White, Ann Arbor, MI (US);

Darren Schipper, Ann Arbor, MI (US);

Assignee:

KAISER OPTICAL SYSTEMS INC., Ann Arbor, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G01J 3/44 (2006.01); G01J 3/28 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0297 (2013.01); G01J 3/027 (2013.01); G01J 3/28 (2013.01); G01J 3/44 (2013.01); G01N 21/65 (2013.01);
Abstract

Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.


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