The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Jun. 11, 2015
Applicant:
Cellview Imaging Inc., Toronto, CA;
Inventors:
Mark Hathaway, Canterbury, GB;
Rishard Weitz, Toronto, CA;
Assignee:
Cellview Imaging Inc., , CA;
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02058 (2013.01); A61B 3/102 (2013.01); G01B 9/02091 (2013.01);
Abstract
In a OCT interferometer it is necessary to balance dispersion within the reference arm with dispersion within the object arm. This is normally done by replicating within the reference arm the components found in the object arm. This adds to the complexity and cost of the OCT interferometer. A method is provided for determining the design of and designing a simplified OCT interferometer, in which the reference arm contains only a single piece of glass of a single glass type. This reduces the cost and complexity of the OCT interferometer, and reduces power loss and undesired reflections within the reference arm.