The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Nov. 17, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Tadashi Kyoso, Kanagawa, JP;

Jun Yamanobe, Kanagawa, JP;

Katsuto Sumi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 29/393 (2006.01); B41J 2/155 (2006.01); B41J 2/21 (2006.01); H04N 1/60 (2006.01); B41J 25/00 (2006.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B41J 2/155 (2013.01); B41J 2/21 (2013.01); B41J 2/2142 (2013.01); B41J 2/2146 (2013.01); B41J 29/38 (2013.01); H04N 1/6033 (2013.01); H04N 1/6036 (2013.01); B41J 2025/008 (2013.01);
Abstract

Provided are an image recording apparatus that efficiently detects defective recording elements causing image defects in a plurality of recording heads and a method of detecting the defective recording elements. An image recording apparatus including: a plurality of recording heads; an indicator acquisition unit for acquiring an indicator which relatively indicates how easily image defects are visually perceived for each color, an appearance ratio setting unit for setting an appearance ratio of a test pattern as a higher value as the indicator of each color becomes higher; a recording unit for recording the test pattern of each color on a recording medium at the appearance ratio; an imaging unit for capturing an image of the test pattern which is recorded on the recording medium; and an analysis unit for analyzing the captured test pattern and detecting a defect of a recording element in the recording head.


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