The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2018
Filed:
Oct. 13, 2014
Koninklijke Philips N.v., Eindhoven, NL;
Michael Grass, Buchholz in der Nordheide, DE;
Klaus Erhard, Hamburg, DE;
Ewald Roessl, Henstedt-Ulzburg, DE;
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
An X-ray system () for acquiring an image of an object has an X-ray detector (), which is segmented into a plurality of neighboring detector tiles. In particular, the image can be a two-dimensional projection image but also a three-dimensional volume of the object reconstructed from a tomosynthesis acquisition. An X-ray detector moving mechanism () is adapted for moving the X-ray detector () at least between a first X-ray detector position and a second X-ray detector position during operation of the X-ray system. An X-ray source (), a collimator () and the X-ray detector () of the X-ray system () are adapted for acquiring a plurality of partial X-ray images through the adjacent detector tiles while irradiating the object with X-ray beams from a plurality of tomographic angles α. The processing unit is adapted for generating a two-dimension image of the object and/or for reconstructing a three-dimensional volume of the object from the acquired partial images.