The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2018

Filed:

Sep. 29, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Nicholas Konkle, Waukesha, WI (US);

Kevin Lee, Waukesha, WI (US);

Connor Douglas McColl, Waukesha, WI (US);

Kevin Kinsey, Waukesha, WI (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/4283 (2013.01);
Abstract

An x-ray detector for obtaining x-ray images of an object is provided that is capable of increasing the ability of the detector to withstand shock and other types of forces acting on the enclosure to prevent and/or limit damage to the internal components of the detector. The enclosure includes an internal filler/force distribution layer formed from a lightweight, rigid material such as rigid foam and/or a suitable structure, such as a honeycomb or other lattice structure. The material is formed or shaped to fill a layer or portion of the interior of the detector that is otherwise empty space defined between the various internal components of the detector. The position and shape of the force distribution layer determines the path of load distribution across or through the enclosure away from the internal components of the detector and is optimized for shock absorption and/or load distribution.


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