The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Apr. 23, 2013
Ciena Corporation, Hanover, MD (US);
Jeffrey Scott Moynihan, Cumming, GA (US);
Matthew W. Connolly, Canton, GA (US);
Ciena Corporation, Hanover, MD (US);
Abstract
Methods and systems can suppress invalid defect detection when Out-Of-Frame (OOF) conditions occur within an Optical Transport Network. One method for processing a report of a defect during an OOF condition may include detecting the OOF condition at a downstream node, detecting an indication of the defect caused by the OOF condition, suppressing a report associated with the indication of the defect, determining whether the OOF condition is clear, determining whether the indication of the defect is still present if the OOF condition is clear; and cancelling the report if the indication of the defect is not present. A network node which processes a report of a defect during an OOF condition may include a network interface, and a processor which is coupled to the network interface. The processor may be configured to perform a method for suppressing invalid defect detection during OOF conditions.