The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Feb. 24, 2014
Litepoint Corporation, Sunnyvale, CA (US);
Jonathan Barry Hirst, Sunnyvale, CA (US);
Adam Martin Smith, San Ramon, CA (US);
LITEPOINT CORPORATION, Sunnyvale, CA (US);
Abstract
Method for testing multiple signal transceiver devices under test (DUTs), such as data packet signal transceivers, with a shared DUT testing resource, such as a tester having a single vector signal generator (VSG) and a single vector signal analyzer (VSA). Requests by the DUTs for access to tester resources (e.g., to receive signals from the signal generator or provide signals to the signal analyzer) are prioritized based upon tester availability and whether the requesting DUT requires sole access or can share access to the tester. If the tester is unavailable, DUT requests are queued according to their respective priorities to await tester availability. As a result, access to shared tester resources can be managed dynamically to minimize test time while testing multiple DUTs concurrently.