The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
May. 26, 2017
Applicant:
Keysight Technologies, Inc., Minneapolis, MN (US);
Inventors:
Joseph M. Gorin, Santa Rosa, CA (US);
Gordon Strachan, Santa Rosa, CA (US);
Assignee:
Keysight Technologies, Inc., Santa Rosa, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 1/10 (2006.01); G06F 17/18 (2006.01); H04B 17/23 (2015.01); H04B 17/336 (2015.01); H04B 1/00 (2006.01);
U.S. Cl.
CPC ...
H04B 1/1027 (2013.01); G06F 17/18 (2013.01); H04B 1/0085 (2013.01); H04B 17/23 (2015.01); H04B 17/336 (2015.01);
Abstract
Measurement systems and methods are provided for performing preselection to remove images and spurs from a signal being measured that automatically determines a threshold value that is used in the preselection algorithm. Using the automatically-determined threshold value in the preselection algorithm improves image and spur removal from the final trace that is displayed on the display device of the measurement system by trading off the risk of images or spurs being contained in the final trace against the average level of noise bias.