The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

May. 18, 2016
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventors:

Bryan Kris, Gilbert, AZ (US);

James Bartling, Chandler, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05F 1/56 (2006.01); H02M 3/156 (2006.01); G01R 19/00 (2006.01); G01R 19/255 (2006.01); H02M 1/08 (2006.01); H03F 3/45 (2006.01); H03G 3/20 (2006.01); H03M 1/12 (2006.01); H02M 1/00 (2006.01);
U.S. Cl.
CPC ...
H02M 3/156 (2013.01); G01R 19/003 (2013.01); G01R 19/255 (2013.01); H02M 1/08 (2013.01); H03F 3/45 (2013.01); H03G 3/20 (2013.01); H03M 1/1245 (2013.01); H02M 2001/0009 (2013.01); H03F 2203/45288 (2013.01);
Abstract

The average of a complex waveform measured over a time period may be determined by first converting the complex waveform to a voltage, then converting this voltage to a current and using this current to charge a capacitor. At the end of the measurement time period the voltage charge (sample voltage) on the capacitor may be sampled by a sample and hold circuit associated with an analog-to-digital converter (ADC). Then the voltage charge on the sample capacitor may be removed, e.g., capacitor plates shorted by a dump switch in preparation for the next average of the complex waveform sample measurement cycle. The ADC then converts this sampled voltage charge to a digital representation thereof and a true average of the complex waveform may be determined, e.g., calculated therefrom in combination with the measurement time period.


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