The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Dec. 01, 2017
Applicant:

Macom Technology Solutions Holdings, Inc., Lowell, MA (US);

Inventors:

Alex A. Behfar, Keswick, VA (US);

Malcolm R. Green, Lansing, NY (US);

Cristian Stagarescu, Ithaca, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01S 5/00 (2006.01); H01S 5/20 (2006.01); H01S 5/22 (2006.01); H01S 5/02 (2006.01); H01S 5/10 (2006.01); H01S 5/343 (2006.01); H01S 5/12 (2006.01); H01S 5/223 (2006.01); G01R 31/26 (2014.01); H01S 5/028 (2006.01);
U.S. Cl.
CPC ...
H01S 5/0014 (2013.01); G01R 31/26 (2013.01); H01S 5/0042 (2013.01); H01S 5/0203 (2013.01); H01S 5/0287 (2013.01); H01S 5/1014 (2013.01); H01S 5/12 (2013.01); H01S 5/20 (2013.01); H01S 5/22 (2013.01); H01S 5/223 (2013.01); H01S 5/34306 (2013.01); H01S 5/34313 (2013.01); H01S 5/34333 (2013.01); G01R 31/2635 (2013.01); H01S 5/0201 (2013.01); H01S 5/028 (2013.01);
Abstract

A laser chip having a substrate, an epitaxial structure on the substrate, the epitaxial structure including an active region and the active region generating light, a waveguide formed in the epitaxial structure extending in a first direction, the waveguide having a front etched facet and a back etched facet that define an edge-emitting laser, and a first recessed region formed in the epitaxial structure, the first recessed region being arranged at a distance from the waveguide and having an opening adjacent to the back etched facet, the first recessed region facilitating testing of an adjacent laser chip prior to singulation of the laser chip.


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