The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Feb. 21, 2014
Applicant:

Vega Grieshaber KG, Wolfach, DE;

Inventors:

Josef Fehrenbach, Haslach, DE;

Roland Welle, Hausach, DE;

Levin Dieterle, Wolfach, DE;

Assignee:

VEGA GRIESHABER KG, Wolfach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 1/22 (2006.01); G01F 23/284 (2006.01); H01Q 3/06 (2006.01); H04B 17/10 (2015.01); G01B 15/04 (2006.01);
U.S. Cl.
CPC ...
H01Q 1/225 (2013.01); G01B 15/04 (2013.01); G01F 23/284 (2013.01); H01Q 1/2291 (2013.01); H01Q 3/06 (2013.01); H04B 17/103 (2015.01);
Abstract

A fill level measurement device for determining a topology of a surface of a filling material or of a bulk material is provided, including a rotatable antenna including an array of radiator elements configured to emit a measurement signal towards the surface and to receive a reflected measurement signal reflected from the surface, and a high-frequency signal processor configured to generate the measurement signal and to at least partially process the received reflected measurement signal; and a power supply and communications circuitry, coupled to the high-frequency signal processor by a sliding contact or a pair of coils, and configured to supply the high-frequency signal processor with electrical power for measurement operation.


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