The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Apr. 20, 2015
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Deborah A. Neumayer, Danbury, CT (US);

Katherine L. Saenger, Ossining, NY (US);

Assignee:

GLOBALFOUNDRIES INC., Grand Cayman, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/00 (2006.01); H01L 31/0224 (2006.01); H01L 31/068 (2012.01); H01L 31/0747 (2012.01); H01L 31/18 (2006.01); H01L 21/02 (2006.01); H01L 21/225 (2006.01); H01L 21/268 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 31/022425 (2013.01); H01L 21/02532 (2013.01); H01L 21/02592 (2013.01); H01L 21/02686 (2013.01); H01L 21/2257 (2013.01); H01L 21/268 (2013.01); H01L 21/76838 (2013.01); H01L 31/068 (2013.01); H01L 31/0747 (2013.01); H01L 31/1804 (2013.01); Y02E 10/547 (2013.01); Y02P 70/521 (2015.11);
Abstract

Techniques and structures for laser doping of crystalline semiconductors using a dopant-containing amorphous silicon stack for dopant source and passivation are provided. An example method includes forming a dopant-containing amorphous silicon layer stack on at least one portion of a surface of a crystalline semiconductor layer; and irradiating a selected area of the dopant-containing amorphous silicon layer stack, wherein the selected area of the dopant-containing amorphous silicon layer stack interacts with an upper portion of the underlying crystalline semiconductor layer to form a doped, conductive crystalline region, and each non-selected area of the dopant-containing amorphous silicon layer stack remains intact on the at least one portion of the surface of the crystalline semiconductor layer.


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