The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Mar. 08, 2017
Applicants:

Krishna Prasad Agara Venkatesha Rao, Bangalore, IN;

Srinidhi Srinivasa, Bangalore, IN;

Inventors:
Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/097 (2006.01); G06T 7/80 (2017.01); H04N 5/225 (2006.01); G06T 7/73 (2017.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06T 7/80 (2017.01); G06K 9/4638 (2013.01); G06T 7/74 (2017.01); H04N 5/2258 (2013.01);
Abstract

One aspect determines centroids of a plenoptic image, which correspond to the center view of the plenoptic image. A search band spanning a range of different values along a search direction (e.g., range of Δy) is determined. Multiple slices of the plenoptic image are taken at different values of the search coordinate (i.e., different y values). Because the plenoptic image has a periodic structure imposed by the periodicity of the microlens array, each slice will have a strong frequency component at this fundamental frequency. A slice corresponding to the centroid location (i.e., value of y at the centroid) is selected based on analysis of these frequency components. In one approach, the slice with the weakest component at this fundamental frequency is selected as the centroid. A similar approach can be performed in the orthogonal direction to obtain the two-dimensional coordinates of the centroids.


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