The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jul. 25, 2016
PT Papertech Inc., North Vancouver, CA;
Juha Reunanen, Helsinki, FI;
PT PAPERTECH INC., , CA;
Abstract
A method for facilitating detection of at least one anomaly in a representation of a product having a pattern is provided. The method involves causing at least one processor to receive image data representing the product during processing, identify from the image data generally similar images representing respective instances of a repeated aspect of the pattern, each of the images including image element values, generate a set of corresponding image element values including an image element value from each image, identify at least one image element value from the set of corresponding image element values to be excluded from a subset of the set of corresponding image element values, generate at least one criterion based on the subset, and cause the at least one criterion to be used to facilitate identification of the at least one anomaly. Other methods, apparatuses, systems, and computer readable media are also provided.