The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Sep. 28, 2016
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Krishnaram Kenthapadi, Sunnyvale, CA (US);

Stuart MacDonald Ambler, Longmont, CO (US);

Parul Jain, Cupertino, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/60 (2013.01); G06F 21/62 (2013.01);
U.S. Cl.
CPC ...
G06F 21/604 (2013.01); G06F 21/6218 (2013.01);
Abstract

In an example, a plurality of segments of percentile information indicating submitted confidential data values from users matching at least one attribute of a submitting user are retrieved. Then, for each of the segments, an interquartile range is calculated for a first and a second of a plurality of percentiles in the segment, an initial lower limit is computed for the segment by taking a maximum of zero or the difference between the value for the first of the plurality of percentiles and a product of a preset alpha parameter and the interquartile range, and interpolation is performed on values for the plurality of percentiles for the segment to obtain values for a third percentile. The initial lower limits and the interpolated values for the third percentiles are aggregated across the segments. A merged lower limit is determined by applying a function to the aggregated initial lower limits and aggregated interpolated values.


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