The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10042981 B1

Date of Patent:

Aug. 07, 2018

Filed:

Nov. 25, 2014

Method and apparatus for supporting task scheduling in a radiation therapy workflow via prediction of critical workload

Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Marco Henricus Maria Janssen, Valkenswaard, NL;

Thomas Netsch, Hamburg, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:

Primary Examiner:

Wissam Rashid

Int. Cl.

CPC ...

G06F 9/46 (2006.01); G06F 19/00 (2018.01); G06Q 10/06 (2012.01); G06F 9/50 (2006.01); G16H 40/20 (2018.01); G06Q 50/22 (2018.01);

U.S. Cl.

CPC ...

G06F 19/327 (2013.01); G06F 9/50 (2013.01); G06F 19/3481 (2013.01); G06Q 10/06 (2013.01); G16H 40/20 (2018.01); G06Q 50/22 (2013.01);

Abstract

A method and related system for supporting task scheduling. Completion times of tasks of a process are predicted based on historical data held in a database (HIS). Based on the predictions, a workload measure for a resource associated with performing the task is computed. Also, there is established whether the predicted completion times will result in overshooting predefined due-dates as held in a rules database (DB-REG). The work load measure and/or the overshoot is indicted as graphical indicators in a graphical user interface (GUI). The workload measure and/or the overshoot indicators are computed and displayed in real-time.

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