The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Feb. 24, 2015
Applicant:

Mikron Agie Charmilles Ag, Nidau, CH;

Inventors:

Jean-Philippe Besuchet, Neuchatel, CH;

Jérémie Monnin, Nidau, CH;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G05B 15/02 (2006.01); B23Q 17/09 (2006.01); G05B 19/404 (2006.01); G05B 19/4065 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30705 (2013.01); B23Q 17/0976 (2013.01); G05B 15/02 (2013.01); G05B 19/404 (2013.01); G05B 19/4065 (2013.01); G05B 2219/41256 (2013.01);
Abstract

A chatter database system, which includes a central chatter database, which is fed with data corresponding to the machining and chatter conditions of machining tools, particularly a milling, turning, drilling or boring machine. The data fed to the central chatter database is obtained and collected from at least two individual machining tools included in the chatter database system. The data is sent to the central chatter database via a data connection, preferably via a secured network, to generate chatter stability maps based on real encountered conditions.


Find Patent Forward Citations

Besuchet, Jean-Philippe. (2018). Database for chatter predictions (U.S. Patent No. 10042922). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10042922

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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