The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jun. 10, 2015
International Business Machines Corporation, Armonk, NY (US);
Wei Huang, Beijing, CN;
Jing Jing Liu, Beijing, CN;
DaJiang Tao, Beijing, CN;
Chen Wang, Beijing, CN;
Sheng Zhao, Beijing, CN;
Zan Zhou, Beijing, CN;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An index for large databases is disclosed. Data is grouped into clusters and the clusters are grouped into levels of detail. Analysis results are determined based on progressive data sampling. Sampling is conducted based on the level of detail required and/or the resources (time or computing resources) that are available. Larger, more concentrated clusters, at higher levels of detail, are sampled more sparsely. Smaller, more diffuse clusters, at lower levels of detail, are sampled more intensively. Analysis results, including outlier data, include proportional representation from the whole database up to the level of detail required. Results are quickly determined with specified degree of accuracy, based on initial sampling, and are refined with subsequent sampling.