The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jun. 16, 2017
Applicant:

Autodesk, Inc., San Rafael, CA (US);

Inventors:

Oytun Akman, Kensington, CA (US);

Ronald Poelman, San Rafael, CA (US);

Seth Koterba, Valrico, FL (US);

Assignee:

Autodesk, Inc., San Rafael, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06K 9/46 (2006.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06F 17/3053 (2013.01); G06F 17/30247 (2013.01); G06F 17/30598 (2013.01); G06K 9/46 (2013.01); G06T 17/20 (2013.01);
Abstract

A method, system, apparatus, article of manufacture, and computer-readable storage medium provide the ability to merge multiple point cloud scans. A first raw scan file and a second raw scan file (each including multiple points) are imported. The scan files are segmented by extracting segments based on geometry in the scene. The segments are filtered to reduce a number of segments and identify features. A set of candidate matching feature pairs are acquired by coarsely registering features from one scan to features from another scan. The candidate pairs are refined by improving alignment based on corresponding points in the features. The candidate pairs are scored and then merged based on the scores.


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