The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Dec. 02, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Scott R. Carrier, Apex, NC (US);

Lee M. Surprenant, Cary, NC (US);

Amy E. Veatch, Apex, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 17/24 (2006.01); G06F 17/22 (2006.01); G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
G06F 17/243 (2013.01); G06F 17/2241 (2013.01); G06F 17/241 (2013.01); G06F 17/248 (2013.01); G06F 17/278 (2013.01); G06F 17/2725 (2013.01); G06F 17/30684 (2013.01); G06F 17/30702 (2013.01); G06F 17/30731 (2013.01); G06F 17/30876 (2013.01);
Abstract

A method, system and computer-usable medium are disclosed for identifying unchecked criteria within a form. Natural Language Processing (NLP) is applied to unstructured data within a target form to identify elements of a form structure. Analytic analysis is then applied to the resulting form structure elements to identify a hierarchical structure and associated element placement. Implicit selections within the form are then identified by applying rules based upon other selections and their orientation to anchor terms to determine the completeness of the form, based upon aggregation of form elements. The form structure elements and the hierarchy metadata are then processed logically reassemble the form's hierarchy in flattened forms for multi-layer, sub-element anaphora resolution.


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