The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Oct. 30, 2014
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Erin Louise Delacroix, Vallejo, CA (US);

Christina Lynn Lopus, San Francisco, CA (US);

James Lee Baker, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/0482 (2013.01); G06F 3/0484 (2013.01); G06F 3/0481 (2013.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0482 (2013.01); G06F 3/04817 (2013.01); G06F 3/04842 (2013.01); G06F 17/30392 (2013.01); G06F 17/30398 (2013.01); G06F 17/30554 (2013.01); G06F 17/30598 (2013.01);
Abstract

Techniques for providing improved typeahead features are described. According to various embodiments, it is determined that a user has specified, via a user interface, a first metric term. A list of one or more suggested operators associated with the first metric term is then generated and displayed, and it is determined that the user has selected one of the suggested operators. Thereafter, a list of one or more suggested metric terms associated with the selected operator is generated and displayed, and it is determined that the user has selected a second metric term from the suggested metric terms. Thereafter, a custom metric definition data entity that references information defining a custom metric is generated, the information specifying that metric values associated with the custom metric are generated by processing metric values associated with the first metric term and the second metric term based on the selected operator.


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