The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jun. 02, 2015
Applicant:

Rockwell Automation Technologies, Inc., Mayfield, OH (US);

Inventors:

Sujeet Chand, Brookfield, WI (US);

David A. Vasko, Hartland, WI (US);

Timothy Patrick Boppre, Jackson, WI (US);

David A. Snyder, Waukesha, WI (US);

Alex Laurence Nicoll, Brookfield, WI (US);

Brian J. McMullen, Cedarburg, WI (US);

Daniel B. Seger, Kenessaw, GA (US);

John B. Dart, Nashotah, WI (US);

Assignee:

Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 29/06 (2006.01); G05B 19/418 (2006.01); G06F 21/54 (2013.01); G06F 21/56 (2013.01); G06F 21/55 (2013.01); G06F 21/62 (2013.01); G06F 21/86 (2013.01); G06N 99/00 (2010.01);
U.S. Cl.
CPC ...
G05B 19/4185 (2013.01); G06F 21/54 (2013.01); G06F 21/55 (2013.01); G06F 21/566 (2013.01); G06F 21/567 (2013.01); G06F 21/6218 (2013.01); G06F 21/86 (2013.01); G06N 99/005 (2013.01); H04L 63/1408 (2013.01); H04L 63/1416 (2013.01); H04L 63/1441 (2013.01); G05B 2219/31156 (2013.01); G05B 2219/45103 (2013.01); H04L 63/0428 (2013.01); Y02P 90/86 (2015.11);
Abstract

An industrial control system hardened against malicious activity monitors highly dynamic control data to develop a dynamic thumbprint that can be evaluated to detect deviations from normal behavior of a type that suggest tampering or other attacks. Evaluation of the dynamic thumbprint may employ a set of ranges defining normal operation and reflecting known patterns of interrelationship between dynamic variables.


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