The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Sep. 27, 2017
Applicant:
Victor B. Kley, Berkeley, CA (US);
Inventor:
Victor B. Kley, Berkeley, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G03F 7/36 (2006.01);
U.S. Cl.
CPC ...
G03F 7/36 (2013.01); G03F 7/2002 (2013.01); G03F 7/2037 (2013.01);
Abstract
Cantilevers, SPM tips and nanomachining tools are created in the plane of wafers to obtain new and high performance parts. The method produces more parts for any given wafer, then conventional methods and allows every part on any given wafer to be different from any other, permitting great freedom in new SPM and nanomachining techniques and product development.
Kley, Victor. (2018). In-plane scanning probe microscopy tips and tools for wafers and substrates with diverse designs on one wafer or substrate (U.S. Patent No. 10042263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10042263
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile