The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jun. 19, 2015
Boe Technology Group Co., Ltd., Beijing, CN;
Beijing Boe Display Technology Co., Ltd., Beijing, CN;
Dongliang Wang, Beijing, CN;
Xi Chen, Beijing, CN;
Zhenyu Zhang, Beijing, CN;
Linlin Wang, Beijing, CN;
Bin Feng, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
BEIJING BOE DISPLAY TECHNOLOGY CO., LTD., Beijing, CN;
Abstract
The present invention discloses a test device, a method of manufacturing the test device, and a display apparatus. The test device comprises a first test electrode and a second test electrode. The first test electrode is configured to electrically connect with an electrode layer of an array substrate, and the electrode layer is a gate electrode layer or a source-drain electrode layer. The second test electrode is configured to electrically connect with a first transparent conductive layer provided on the array substrate, and the first transparent conductive layer is electrically connected to a second transparent conductive layer provided on a color film substrate. Thereby, it is possible to test liquid crystal characteristics of the whole liquid crystal display panel by applying a DC voltage through the first test electrode and the second test electrode. Thereby, the test of the whole liquid crystal display panel may be directly finished under factory conditions without using the small liquid crystal test box or the like self-made in a laboratory. In this way, the testing result becomes more accurate, the testing process becomes more rapid, and the testing cost becomes lower.