The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jul. 30, 2015
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

John Okerson Crawford, Vail, AZ (US);

David C. Cook, Oro Valley, AZ (US);

Patrick L. McCarthy, Tucson, AZ (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 15/16 (2006.01); G02B 5/10 (2006.01); G02B 27/30 (2006.01); H01Q 19/13 (2006.01); H01Q 5/22 (2015.01); F41G 7/00 (2006.01);
U.S. Cl.
CPC ...
G02B 5/10 (2013.01); G02B 27/30 (2013.01); H01Q 5/22 (2015.01); H01Q 15/16 (2013.01); H01Q 19/132 (2013.01); F41G 7/003 (2013.01); F41G 7/004 (2013.01);
Abstract

A dual-mode optical and RF reflector, and test system using the same. In one example the reflector is a mirror having a reflective surface including a first zone having a first surface precision, wherein a remainder of the reflective surface outside of the first zone has a second surface precision that is substantially lower than the first surface precision, the mirror being configured to collimate and reflect an RF signal from the reflective surface, and to collimate and reflect an optical signal from the first zone.


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