The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Mar. 04, 2016
Applicant:

Nuctech Company Limited, Beijing, CN;

Inventors:

Qiang Wang, Beijing, CN;

Jing Ma, Beijing, CN;

Zhongrong Yang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01V 5/00 (2006.01); G01T 1/29 (2006.01);
U.S. Cl.
CPC ...
G01V 5/0016 (2013.01); G01T 1/2985 (2013.01);
Abstract

X-ray scanning methods and systems are provided in embodiments of the present inventions. According to one illustrative implementation, an exemplary method may comprise: collecting background data when no X-ray is emitted; collecting air data when X-rays are emitted and there is no object to be scanned in an inspection channel; scanning an object to collect original scanning data; and preprocessing the original scanning data according to the background data and the air data to acquire scanned image data. In some embodiments, when performing an X-ray scanning of a static object, implementations may measure the background data and the air data and process the scanning data, thereby solving noise issues caused by mechanical vibration and thus improving the measurement accuracy.


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