The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jan. 29, 2014
Hexagon Technology Center Gmbh, Heerbrugg, CH;
Hexagon Metrology Gmbh, Wetzlar, DE;
Thomas Jensen, Rorschach, CH;
Knut Siercks, Mörschwil, CH;
Peter Champ, Pinner, GB;
Matthias Geil, Herborn, DE;
HEXAGON TECHNOLOGY CENTER GMBH, Heerbrugg, CH;
HEXAGON METROLOGY GMBH, Wetzlar, DE;
Abstract
A distance measuring method for a point on an object is performed by emitting measurement radiation. When an optical measurement axis of the measurement radiation is aligned with the point to be measured, an optical measurement point region is defined by the beam cross section of the radiation on the object. The beam cross section may be, for example, a maximum of eight times the standard deviation of a Gaussian steel profile of the measurement radiation. The the distance to the point on the object is determined by receiving measurement radiation reflected from the object. The method includes altering, at least once, a measurement direction as emission direction of the measurement radiation with respective emission and reception of the measurement radiation. Altering the measurement direction is carried out such that respective area centroids defined by the beam cross section on the object lie within the measurement point region.