The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Oct. 30, 2015
Applicant:
Institut National D'optique, Quebec, CA;
Inventors:
Alain Bergeron, Québec, CA;
Linda Marchese, Quebec, CA;
Assignee:
INSTITUT NATIONAL D'OPTIQUE, Quebec, CA;
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/90 (2006.01); G01S 7/40 (2006.01); G01S 15/89 (2006.01); G01S 17/89 (2006.01); G06T 5/50 (2006.01); G02B 27/58 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G01S 13/9035 (2013.01); G01S 7/4004 (2013.01); G01S 13/9005 (2013.01); G01S 15/8997 (2013.01); G01S 17/895 (2013.01); G02B 27/58 (2013.01); G03H 2001/046 (2013.01); G06T 5/50 (2013.01);
Abstract
There is described a method for processing data generated by a synthetic aperture imaging system, comprising: receiving raw data representative of electromagnetic signals reflected by a target area to be imaged; receiving a parameter change for the synthetic aperture imaging system; digitally correcting the raw data in accordance with the parameter change, thereby compensating for the parameter change in order to obtain corrected data; and generating an image of the target area using the corrected data.