The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Apr. 16, 2013
Keysight Technologies, Inc., Minneapolis, MN (US);
Joel P. Dunsmore, Sebastopol, CA (US);
Johan Ericsson, Windsor, CA (US);
Keysight Technologies, Inc., Santa Rosa, CA (US);
Abstract
A method of calibrating a test instrument comprises determining a first response of a calibration device on the test instrument over a first set of operating ranges, determining a derived second response of the calibration device on the test instrument over a second set of operating ranges based on the first response, measuring the second response of the calibration device on the test instrument over the second set of operating ranges, and determining correction factors of the test instrument for the second set of operating ranges based on a comparison between the measured second response and the derived second response.