The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jul. 08, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Dae-ho Lee, Seongnam-si, KR;

Sang-young Zho, Seoul, KR;

Joon-soo Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/387 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/387 (2013.01); G01R 33/56518 (2013.01);
Abstract

A magnetic field measuring method in a magnetic resonance imaging (MRI) apparatus includes applying a radio frequency (RF) pulse to an object, acquiring first and second echo signals from a first readout gradient according to test gradients having different intensities, acquiring third and fourth echo signals from a second readout gradient according to the test gradients having different intensities, and determining a characteristic value of an eddy field based on an echo time (TE) of at least one of the first through the fourth echo signals.


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