The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Apr. 19, 2016
Applicants:

Bridgestone Corporation, Chuo-ku, JP;

The University of Akron, Akron, OH (US);

Inventors:

Toshikazu Miyoshi, Akron, OH (US);

Michael C. Davis, Independence, OH (US);

Jiahuan Hu, Akron, OH (US);

Assignees:

Bridgestone Corporation, Chuo-ku, JP;

The University of Akron, Akron, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 5/00 (2006.01); G01R 33/30 (2006.01); G01N 24/08 (2006.01);
U.S. Cl.
CPC ...
G01R 33/30 (2013.01); G01N 24/08 (2013.01); G01R 33/307 (2013.01);
Abstract

An apparatus and method for testing and analyzing the molecular structure of a sample material in an NMR device are described. A sample is held in a pre-determined stretched state in an apparatus that includes the sample arranged between two body components that are secured together with one or more retaining members that fit around the bodies or portions thereof. The apparatus is inserted into an NMR device to obtain NMR spectrums for analyzing the molecular structure of the samples, for instance, identifying strain-induced crystallinity and quantifying the same at pre-determined stretch ratios of a sample material.


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