The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Dec. 27, 2016
Banyan Biomarkers, Inc., Alachua, FL (US);
Kevin Ka-Wang Wang, Gainesville, FL (US);
Zhiqun Zhang, Auburndale, MA (US);
Ming-Cheng Liu, Plano, TX (US);
Ronald L. Hayes, Alachua, FL (US);
Jitendra Ramanlal Dave, Gaithersburg, MD (US);
Banyan Biomarkers, Inc., Alachua, FL (US);
The United States of America, as Represented by the Secretary of the Army, Washington, DC (US);
Abstract
Processes and materials are provided for the detection, diagnosis, or determination of the severity of a neurological injury or condition, including traumatic brain injury, multiple-organ injury, stroke, Alzeimer's disease, Parkinson disease and Chronic Traumatic Encephalopathy (CTE). The processes and materials include biomarkers detected or measured in a biological sample such as whole blood, serum, plasma, or CSF. Such biomarkers include Tau and GFAP proteins, their proteolytic breakdown products, brain specific or enriched micro-RNA, and brain specific or enriched protein directed autoantibodies. The processes and materials are operable to detect the presence of absence of acute, subacute or chronic brain injuries and predict outcome for the brain injury.