The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Sep. 11, 2014
Applicant:

The Board of Trustees of the Leland Stanford Junior University, Palo Alto, CA (US);

Inventors:

Sean C. Bendall, San Mateo, CA (US);

Garry P. Nolan, Redwood City, CA (US);

Robert M. Angelo, San Francisco, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 33/58 (2006.01); H01J 49/00 (2006.01); G01N 33/68 (2006.01); G01N 33/483 (2006.01); G01N 33/487 (2006.01); G01N 15/10 (2006.01);
U.S. Cl.
CPC ...
G01N 33/58 (2013.01); G01N 15/10 (2013.01); G01N 33/483 (2013.01); G01N 33/48735 (2013.01); G01N 33/5005 (2013.01); G01N 33/6848 (2013.01); H01J 49/0004 (2013.01); G01N 2015/1006 (2013.01); G01N 2458/15 (2013.01);
Abstract

A method of generating a high resolution two-dimensional image of a sample comprising cells and extracellular structures is provided. In certain embodiments, the method comprises: labeling a sample with at least one mass tag, thereby producing a labeled sample; scanning the sample with a secondary ion mass spectrometer (SIMS) ion beam to generate a data set that comprises spatially-addressable measurements of the abundance of the mass tag across an area of the sample; and outputting the data set. In many embodiments, the data set contains the identity and abundance of the mass tag. A system for performing the method is also provided.


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