The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Apr. 24, 2017
Bruker Optik Gmbh, Ettlingen, DE;
Christian Hepp, Gaggenau, DE;
Stephan Luettjohann, Karlsruhe, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
A method for measuring and determining a THz spectrum of a sample () having an improved spectral resolution. Two laser beams () are superimposed, such that two parts () of a superimposed laser radiation are generated, which have a beat frequency in the THz range. The first part () is introduced into an emitter () for generating a THz radiation (), which passes through the sample. The characteristic transmission radiation () thus obtained is forwarded to a detector (), which is activated by the second part () of the superimposed laser radiation. By repetition with different beat frequencies, a measurement signal I(f) of the form I(f)=A(f)·cos [Φ(f)] is obtained for the sample. An auxiliary signal Ĩ(f) shifted by 90° is determined from the measurement signal I(f), with Ĩ(f)=A(f)·cos [Φ(f)±90°]. The THz spectrum S(f) of the sample is determined by the auxiliary signal Ĩ(f), with S(f)=|z(f)|=|I(f)+iĨ(f)|.