The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jan. 21, 2015
Applicant:
Quest Integrated, Inc., Kent, WA (US);
Inventors:
Giovanni Nino, Issaquah, WA (US);
Tyler Blumenthal, Renton, WA (US);
Assignee:
QUEST INTEGRATED, INC., Kent, WA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 7/16 (2006.01); G01L 1/00 (2006.01); G01M 5/00 (2006.01); G01N 19/08 (2006.01); H05K 1/02 (2006.01); G01N 27/20 (2006.01); H05K 1/16 (2006.01); G01N 27/24 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0033 (2013.01); G01M 5/0083 (2013.01); G01N 19/08 (2013.01); G01N 27/205 (2013.01); H05K 1/0293 (2013.01); G01N 27/24 (2013.01); H05K 1/16 (2013.01); H05K 2201/10151 (2013.01);
Abstract
A system includes a substrate having a surface and a circuit with a plurality of conductive paths disposed adjacent (e.g., directly on or separated by a thin layer). The circuit is configured to detect an interruption or alteration of conduction of one or more of the plurality of conductive paths due to a flaw in the substrate. The circuit is further configured to identify the interrupted or altered one or more of the plurality of conductive paths based on one or more electrical characteristics of the circuit.