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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10041855 B1

PDFFull Text
Date of Patent:
Aug. 07, 2018

Filed:

Jan. 21, 2015

Fuse-like sensor, detection and measurement systems

Applicant:

Quest Integrated, Inc., Kent, WA (US);

Inventors:

Giovanni Nino, Issaquah, WA (US);

Tyler Blumenthal, Renton, WA (US);

Assignee:

QUEST INTEGRATED, INC., Kent, WA (US);

Attorney:

Christensen O'Connor Johnson Kindness PLLC

Primary Examiner:

Lisa Caputo

Assistant Examiner:

Roger Hernandez-Prewit

Int. Cl.
CPC ...
G01B 7/16 (2006.01); G01L 1/00 (2006.01); G01M 5/00 (2006.01); G01N 19/08 (2006.01); H05K 1/02 (2006.01); G01N 27/20 (2006.01); H05K 1/16 (2006.01); G01N 27/24 (2006.01);
U.S. Cl.
CPC ...
G01M 5/0033 (2013.01); G01M 5/0083 (2013.01); G01N 19/08 (2013.01); G01N 27/205 (2013.01); H05K 1/0293 (2013.01); G01N 27/24 (2013.01); H05K 1/16 (2013.01); H05K 2201/10151 (2013.01);
Abstract

A system includes a substrate having a surface and a circuit with a plurality of conductive paths disposed adjacent (e.g., directly on or separated by a thin layer). The circuit is configured to detect an interruption or alteration of conduction of one or more of the plurality of conductive paths due to a flaw in the substrate. The circuit is further configured to identify the interrupted or altered one or more of the plurality of conductive paths based on one or more electrical characteristics of the circuit.

Find Patent Forward Citations

Nino, Giovanni. (2018). Fuse-like sensor, detection and measurement systems (U.S. Patent No. 10041855). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10041855

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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