The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Dec. 18, 2015
Centre National DE LA Recherche Scientifique—cnrs, Paris, FR;
Institut D'optique Graduate School, Palaiseau, FR;
Observatoire DE Paris, Paris, FR;
Andrea Bertoldi, Talence, FR;
Ralf Kohlhaas, Gentilly, FR;
Arnaud Landragin, Orsay, FR;
Philippe Luc Bouyer, Talence, FR;
Centre National De La Recherche Scientifique—CNRS, Paris, FR;
Institut D'Optique Graduate School, Palaiseau, FR;
Observatoire De Paris, Paris, FR;
Abstract
Coherent spectroscopic methods are described, to measure the total phase difference during an extended interrogation interval between the signal delivered by a local oscillator () and that given by a quantum system (QS). According to one or more embodiments, the method may comprise reading out at the end of successive interrogation sub-intervals (Ti) intermediate error signals corresponding to the approximate phase difference (φ) between the phase of the LO signal and that of the quantum system, using coherence preserving measurements; shifting at the end of each interrogation sub-intervals (Ti) the phase of the local oscillator signal, by a known correction value ((i)) so as to avoid that the phase difference approaches the limit of the inversion region; reading out a final phase difference (φf) between the phase of the prestabilized oscillator signal and that of the quantum system using a precise measurement with no restriction on the destruction; reconstructing a total phase difference over the extended interrogation interval, as the sum of the final phase difference (φf) and the opposite of all the applied phase corrections figure (I).