The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Sep. 10, 2013
Yong Wang, Toa Payoh, SG;
Yong Wang, Toa Payoh, SG;
Other;
Abstract
Embodiment of the present invention provides various types of optical measurement scaleplates, optical measurement apparatus and method using the optical measurement scaleplates for position measurements. In one embodiment, an optical measurement scaleplate has a substrate and a plurality of marking units each being borne on the substrate at a predetermined position. Each marking unit includes a plurality of optically detectable marking elements. Each of said marking elements has an element value defined a permutation of the element value of each of the marking elements in said marking unit, and each unit value corresponds to a physical quantity. On the substrate there is defined a first direction. The physical quantity includes a first distance between a reference position and said predetermined position along the first direction.