The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Nov. 16, 2017
Fujifilm Corporation, Tokyo, JP;
Hiroaki Takao, Saitama, JP;
Takeshi Misawa, Saitama, JP;
Takeshi Kamiya, Saitama, JP;
Tomonori Masuda, Saitama, JP;
Koudai Fujita, Saitama, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A distance image acquisition apparatus includes a projection unit which performs a plurality of times of light emission with a plurality of light emission intensities to project a first pattern of structured light onto a subject within a distance measurement region, an imaging unit which is provided in parallel with and apart from the projection unit by a baseline length, images the subject in synchronization with each of the plurality of times of light emission, and generates a plurality of captured images corresponding to the plurality of light emission intensities, a normalization unit which normalizes a plurality of captured images with coefficients corresponding to the plurality of light emission intensities to acquire a plurality of normalized images, a discrimination unit which compares a plurality of normalized images and discriminates the first pattern projected from the projection unit, and a distance image acquisition unit.