The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Mar. 01, 2016
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Akihiro Fujii, Tokyo, JP;
Yosuke Tani, Tokyo, JP;
OLYMPUS CORPORATION, Tokyo, JP;
Abstract
A technology is provided that makes it possible for even a beginner to determine whether a measurement result is correct, to thereby prevent the use of incorrect measurement data, and to improve the reliability of an analysis result. In a three-dimensional shape measurement apparatusthat measures a three-dimensional shape of a specimenin a non-contacting manner, a score that evaluates the reliability of measurement data is calculated for each measurement point by use of information obtained during a process of estimating the height of the specimenor the estimated height. Measurement data is processed according to a result of evaluating the measurement data for each measurement point by use of the score.