The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jul. 25, 2013
Applicant:

Honeywell International Inc., Morristown, NJ (US);

Inventors:

Vinod Pathangay, Bangalore, IN;

Mahesh Kumar Gellaboina, Kurnool, IN;

Mohammed Ibrahim Mohideen, Bangalore, IN;

Assignee:

Honeywell International Inc., Morris Plains, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
F23N 5/24 (2006.01); F23G 7/08 (2006.01); G06T 7/00 (2017.01); G06T 7/269 (2017.01);
U.S. Cl.
CPC ...
F23N 5/242 (2013.01); F23G 7/085 (2013.01); G06T 7/0002 (2013.01); G06T 7/269 (2017.01); G06T 2207/10016 (2013.01); G06T 2207/10048 (2013.01); G06T 2207/20081 (2013.01);
Abstract

Methods, systems, and computer-readable and executable instructions are described herein. One method includes receiving a sequence of images of a flare stack area from a thermal imaging component, identifying a first portion of the flare stack area moving at a first threshold optical flow using the sequence of images of the flare stack area, and identifying a second portion of the flare stack area moving at a second threshold optical flow using the sequence of images of the flare stack area.


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