The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Oct. 06, 2015
Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;
Kyoung-Whan Oh, Suwon-si, KR;
Sung-Chul Go, Hwaseong-si, KR;
Eun-Kyung Hong, Seoul, KR;
Dong-Hyun Kim, Hwaseong-si, KR;
Jin-Ha Choi, Yongin-si, KR;
SAMSUNG ELETCRONICS CO., LTD., Suwon-si, Gyeonggi-do, KR;
Abstract
A method of processing measurement information in which a determined parameter value is determined at each of a plurality of measurement times including determining a predicted parameter value at each of the measurement times, determining an error range at each of the measurement times based on the predicted parameter value, obtaining a measured parameter value at each of the measurement times, and determining the determined parameter value based on the predicted parameter value, the measured parameter value, and the error range.