The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jun. 23, 2016
Minute Key Inc., Boulder, CO (US);
Richard L. Gardner, Jr., Loveland, CO (US);
Bradford Shayne Cooley, Escondido, CA (US);
David Kortbawi, Escondido, CA (US);
MINUTE KEY INC., Boulder, CO (US);
Abstract
A system for duplicating a master key includes a clamping mechanism for receiving and positioning a master key. The master key defines a major key axis and an intermediate key axis along which a key blade variably extends. The key blade has an upper surface and a minor key axis along a key thickness. A mechanical measurement device includes a probe that deflects along the intermediate key axis during a measurement process. A movement mechanism imparts relative motion along the major key axis between the mechanical measurement device and the master key. The mechanical probe follows the upper surface of the key blade. The mechanical measurement device generates a signal indicative of the deflection of the probe. A processor receives the signal and generates information usable for defining the machining of a duplicate key.