The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2018
Filed:
Jul. 23, 2015
General Electric Company, Schenectady, NY (US);
University of Washington, Seattle, WA (US);
David Roger Moore, Schenectady, NY (US);
Matthew Jeremiah Misner, Delanson, NY (US);
Andrew Arthur Paul Burns, Schenectady, NY (US);
Joshua Bishop, Seattle, WA (US);
Lisa K. Lafleur, Seattle, WA (US);
Maxwell Wheeler, Seattle, WA (US);
GENERAL ELECTRIC COMPANY, Schenectady, NY (US);
Abstract
The present disclosure relates to a sample assessment device. By way of example, the sample assessment device may include a substrate including a sample application region; an amplification region comprising a plurality of amplification reagents; a waste region comprising an entrance fluidically coupled to the amplification region and extending away from the amplification region; and a detection region spaced apart from the amplification region. The sample assessment device may also include a valve coupled to the substrate and configured to separate the amplification region from the detection region in a closed configuration, wherein the amplification region and the valve are positioned on the sample assessment device between the sample application region and the detection region and wherein the sample assessment device is configured to permit lateral flow from the amplification region to the detection region when the valve is in an open configuration.