The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 07, 2018

Filed:

Jan. 07, 2015
Applicants:

National Cancer Center, Gyeonggi-do, KR;

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Kwang Gi Kim, Seoul, KR;

Jeong Min Hwang, Gyeonggi-do, KR;

Hee Kyung Yang, Gyeonggi-do, KR;

Sang Beom Han, Gyeonggi-do, KR;

Ji Eun Oh, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 3/00 (2006.01); A61B 3/12 (2006.01); A61B 3/14 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/12 (2013.01); A61B 3/14 (2013.01); G06T 7/0012 (2013.01); G06T 2207/20061 (2013.01); G06T 2207/30041 (2013.01);
Abstract

The present invention relates to a method for detecting a defective zone of a retinal nerve fiber layer (hereinafter, referred to as a RNFL), wherein a green channel image is extracted from an acquired fundus image, and polar coordinate conversion is conducted with reference to the center of a detected optic disc with regard to the image, thereby detecting a defective area of the RNFL.


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