The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Aug. 01, 2017
Applicant:

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;

Inventors:

Hideki Kawamura, Nagaokakyo, JP;

Nobuhito Tsubaki, Nagaokakyo, JP;

Assignee:

MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto-Fu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 19/07 (2006.01); G06K 19/073 (2006.01); G06K 19/077 (2006.01);
U.S. Cl.
CPC ...
G06K 19/07309 (2013.01); G06K 19/0716 (2013.01); G06K 19/0772 (2013.01); G06K 19/07745 (2013.01); G06K 19/07775 (2013.01);
Abstract

An RF system is provided that includes an RFID card and a reader-writer device. The RFID card includes a substrate, an RFIC element, an antenna coil, and a deformation sensor. The reader-writer device and the RFID card transmit and receive predetermined information between an antenna coil of the RFID card and an antenna coil of the reader-writer device through a magnetic field. The RFIC element transmits the first signal via the antenna coil when the deformation sensor does not detect bending deformation of the substrate, and the RFIC element transmits the second signal via the antenna coil when the deformation sensor detects the bending deformation of the substrate.


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