The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

May. 09, 2017
Applicant:

Olympus Corporation, Hachioji-shi, Tokyo, JP;

Inventor:

Yoichi Yaguchi, Hino, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06K 9/00 (2006.01); G06F 17/30 (2006.01); G06T 7/12 (2017.01); G06T 7/155 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00765 (2013.01); G06F 17/30017 (2013.01); G06K 9/00684 (2013.01); G06T 7/12 (2017.01); G06T 7/155 (2017.01);
Abstract

An image processing device including an image sequence acquisition section that acquires an image sequence that includes a plurality of images; and a processing section that performs an image summarization process that deletes some of the plurality of images included in the image sequence acquired by the image sequence acquisition section to acquire a summary image sequence. The processing section detecting a scene change from the image sequence, setting a partial image sequence that includes images among the plurality of images included in the image sequence based on the detected scene change, selecting a reference image and a determination target image from the partial image sequence, and determining whether or not the determination target image can be deleted based on deformation information about the reference image and the determination target image.


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