The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Jan. 18, 2016
GM Global Technology Operations Llc, Detroit, MI (US);
Diana M Wegner, Bloomfield Hills, MI (US);
Jeffrey A. Abell, Rochester Hills, MI (US);
Michael A. Wincek, Rochester, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
An automated method for discovering features in a repeatable process includes measuring raw time series data during the process using sensors. The time series data describes multiple parameters of the process. The method includes receiving, via a first controller, the time series data from the sensors, and stochastically generating candidate features from the raw time series data using a logic block or blocks of the first controller. The candidate features are predictive of a quality of a work piece manufactured via the repeatable process. The method also includes determining, via a genetic or evolutionary programming module, which generated candidate features are most predictive of the quality of the work piece, and executing a control action with respect to the repeatable process via a second controller using the most predictive candidate features. A system includes the controllers, the programming module, and the sensors.